A.11: DFDD: Difference between revisions

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• '''Short Description''':  
• '''Short Description''':  
A two-phase, digital-twin-assisted fault diagnosis method which is using deep transfer learning fault diagnosis both in the development and maintenance phases.


• '''Reference, URL''': https://ieeexplore.ieee.org/document/8598879


• '''Reference, URL''':  
• '''Applicable Business Category'': Manufacturing


• '''Relevant Domain/Industry''': Manufacturing
• '''Application in relevant Projects/Initiatives''':  


• '''Application in relevant Projects/Initiatives''':  
• '''Asset Type''': ML Model
 
• '''AI Breadth''': ML


• '''Type''':  
• '''Learning Ability''': Deep Transfer Learning


• '''AI Breadth''':  
• '''Related technologies''': Digital Twin, Deep Learning, Fault Diagnosis, Real Time analytic


• '''Learning Ability''':
• '''Applicable Research Area''': Integrative AI


• '''Related technologies''':
• '''Applicable Technical Category''': Machine Learning


• '''License Information''': Proprietary license
• '''License Information''': GNU General Public License version 3


• '''Related to circularity and sustainability''':  
• '''Related to circularity and sustainability''': Yes_Fault Diagnosis/Eco-Design


• '''Audience''': Manufacturer
• '''Audience''': Developers





Latest revision as of 08:55, 27 December 2024

Short Description: A two-phase, digital-twin-assisted fault diagnosis method which is using deep transfer learning fault diagnosis both in the development and maintenance phases.

Reference, URL: https://ieeexplore.ieee.org/document/8598879

• 'Applicable Business Category: Manufacturing

Application in relevant Projects/Initiatives:

Asset Type: ML Model

AI Breadth: ML

Learning Ability: Deep Transfer Learning

Related technologies: Digital Twin, Deep Learning, Fault Diagnosis, Real Time analytic

Applicable Research Area: Integrative AI

Applicable Technical Category: Machine Learning

License Information: GNU General Public License version 3

Related to circularity and sustainability: Yes_Fault Diagnosis/Eco-Design

Audience: Developers



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